ANSI - American National Standards Institute
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2007 Biometric Consortium Conference: A Look at the Latest Industry Advancements

New York, Jul 30, 2007

From passports to airport security to electronic commerce, the use of biometrics applications as verification and identification tools is quickly expanding in today’s society. Even Walt Disney World, the nation’s most popular tourist attraction, records visitors’ finger geometry measurements in an effort to prevent ticket fraud and resale.

A look at the latest advancements in biometrics research, development, and technologies will be the focus of the 2007 Biometrics Consortium Conference, to be held September 11-13, in Baltimore, Maryland. The American National Standards Institute and ANSI members IEEE (the Institute of Electrical and Electronics Engineers) and INCITS (InterNational Committee for Information Technology Standards) serve as supporting organizations of the event.

The two-and-a-half day conference will encompass presentations, seminars, technology exhibits, and panel discussions led by internationally recognized experts in biometric technologies and solutions. Topics to be explored are appropriate for a wide variety of individuals, from policy developers and decision makers to government and industry executives, information technology developers and users. Dr. John Marburger III, director of the Office of Science and Technology Policy in the Executive Office of the President will deliver the keynote address.

With a focus on biometric-based solutions for homeland security and border crossing, ID theft prevention, and electronic commerce, the conference will also address issues of privacy and security. Ongoing national and international standards development efforts will also serve as chief topics for discussion. ANSI members Bioscrypt, the National Institute of Standards and Technology (NIST), and the U.S. Departments of Homeland Security and Defense will lead several conference sessions. Jeffrey Dunn of the National Security Agency and Fernando Podio of NIST will serve as co-chairs.

The conference is open to the general public. For registration details, please visit the conference registration center.

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