As part of its effort to engage with stakeholders to identify critical challenges in measurement science, standards development, and measurement services to support the U.S. semiconductor industry, the U.S. Commerce Department's National Institute of Standards and Technology (NIST) will host a Semiconductor Metrology R&D Workshop Series, to be held April 6-7 and April 20-21.
The sessions will include facilitated roundtables to identify the metrology needs and priorities of the semiconductor industry and related research and development (R&D) for next generation microelectronics. NIST reports that the information gathered from these workshops will help to inform the development of NIST’s metrology R&D plan in response to the U.S. Congress authorized set of programs as part of the Creating Helpful Incentives to Produce Semiconductors for America Act (CHIPS Act).
The programs would help restore U.S. leadership in semiconductor manufacturing by providing incentives and encouraging investment to expand manufacturing capacity at both advanced and mature nodes. Additionally, the programs would also help to grow the research and innovation ecosystem for microelectronics and semiconductor R&D in the U.S., including through infrastructure investments necessary to transition research advances more seamlessly into manufacturing, as NIST reports.
Register for Workshop 1 on April 6, 2022 – April 7, 2022, and Workshop 2 on April 20, 2022 – April 21, 2022. For more details and the full agenda please visit NIST’s page. Space is limited, and preference will be given to registrants on a first come first served basis.